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Wyniki wyszukiwania wyrażenia: scanning electron microscopy (znaleziono: 2)

A comparison of various imaging modes in scanning electron microscopy during evaluation of selected Si/refractory sessile drop couples after wettability tests at ultra-high temperature


In this work, FEI SciosTM field emission gun scanning electron microscope (FEG SEM) equipped with a unique combination of analytical and imaging detectors was utilized to examine structure and chemistry of selected Si/refractory couples...

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High-temperature interaction of molten vermicular graphite cast iron with Al2O3 substrate


The wetting behavior and reactivity between molten cast iron (originally vermicular graphite cast iron, containing in wt. %: 3.70 C, 2.30 Si, 0.44 Mn, 0.054 P, 0.017 Mg, 0.015 S) and commercial polycrystalline alumina (Al2O3 ...

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